Description: Reliability Prediction for Microelectronics (Quality and Reliability Engineering Series) [Hardcover] Bernstein, Joseph B.; Bensoussan, Alain and Bender, Emmanuel Product Overview RELIABILITY PREDICTION FOR MICROELECTRONICSWiley Series in Quality & Reliability EngineeringREVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOKReliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditionsDetailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and moreNew multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTIReliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing. Read more Details Publisher : Wiley; 1st edition (February 20, 2024) Language : English Hardcover : 400 pages ISBN-10 : 1394210930 ISBN-13 : 30 Item Weight : 1.55 pounds Dimensions : 7.9 x 1.1 x 9.26 inches Best Sellers Rank: #2,662,791 in Books (See Top 100 in Books) #267 in Microelectronics #343 in Industrial Quality Control #152,888 in Textbooks (Special Features Stores) #267 in Microelectronics Stock Photos Please Note: All of our book listings use stock photos unless otherwise stated. Please read our descriptions for accurate conditions and editions, don't use the photos! Free Shipping We ship worldwide. We have multiple warehouses around the world, so please note the extended handling time on certain listings.
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ISBN: 1394210930
ISBN10: 1394210930
ISBN13: 9781394210930
EAN: 9781394210930
MPN: does not apply
Brand: Wiley
GTIN: 09781394210930
Number of Pages: 400 Pages
Publication Name: Reliability Prediction for Microelectronics
Language: English
Publisher: Wiley & Sons, Incorporated, John
Publication Year: 2024
Subject: Engineering (General), Electronics / Microelectronics, Quality Control
Item Height: 1.1 in
Type: Textbook
Item Weight: 25 Oz
Author: Emmanuel Bender, Alain Bensoussan, Joseph B. Bernstein
Item Length: 9.3 in
Subject Area: Technology & Engineering
Series: Quality and Reliability Engineering Ser.
Item Width: 7.9 in
Format: Hardcover
